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Why Thermal Metrology Must Evolve for Next-Generation Semiconductors

IEEE Spectrum AI Laser Thermal March 23, 2026
Why Thermal Metrology Must Evolve for Next-Generation Semiconductors

An in-depth examination of how rising power density, 3D integration, and novel materials are outpacing legacy thermal measurement — and what advanced metrology must deliver.What Attendees will LearnWhy heat is now the dominant constraint on semiconductor scaling — Explore how heterogeneous integrati

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